TRAVELLING MICROSCOPE KCX-183

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• 1. Advanced Precision Travelling Microscope
• The KCX-183 Travelling Microscope is designed for laboratory experiments requiring accurate observation and measurement of small linear distances.
• Its optical and mechanical systems allow users to align the microscope with reference points and determine displacement through calibrated movement.
• 2. Three-Axis Measurement System
• The microscope supports movement along horizontal, vertical and transverse directions.
• This arrangement provides flexibility for positioning the optical system during scientific measurements and laboratory experiments.
• 3. Up to 20 cm Horizontal Travel
• The KCX-183 supports horizontal movement up to 20 cm.
• This range allows users to measure horizontal displacement between selected reference points within the instrument's operating limits.
• 4. Up to 15 cm Vertical Travel
• The microscope provides vertical movement up to 15 cm, supporting experiments involving vertical displacement and optical measurement.
• 5. Up to 25 mm Transverse Travel
• The instrument supports transverse movement up to 25 mm, providing an additional positioning adjustment perpendicular to the principal measurement direction.
• 6. Achromatic 2X Objective Lens
• The microscope incorporates an achromatic 2X objective lens with a focal length of 50 mm.
• The achromatic design helps reduce chromatic aberration and supports clear observation of suitable reference points.
• 7. High-Quality 10X Precision Eyepiece
• The KCX-183 includes a 10X precision eyepiece designed for examining fine reference markings and optical measurement points.
• 8. Nominal 20X Optical Magnification
• The combination of the 2X objective and 10X eyepiece provides a nominal optical magnification of 20X.
• This magnification supports visual alignment with small reference points during laboratory experiments.
• 9. Precision Vernier Scale
• The microscope features a precision vernier scale for measuring displacement.
• The vernier arrangement allows users to obtain readings more precisely than a basic main scale alone.
• 10. Fine Vernier Measurement System
• The KCX-183 incorporates a fine vernier measurement system intended to support controlled readings during optical and dimensional experiments.
• The exact least count depends on the calibrated scale configuration.
• 11. Controlled Mechanical Movement
• The instrument's movement controls allow users to position the microscope along the available measurement axes.
• This supports repeatable alignment during scientific investigations.
• 12. Heavy-Duty Metal Construction
• The KCX-183 features a heavy-duty metal body designed to provide durability and mechanical rigidity.
• Its construction supports routine use in educational and scientific laboratories.
• 13. Stable Support Base
• The microscope includes a stable metal support base designed to minimize unwanted movement during measurement.
• 14. Suitable for Physics Experiments
• The instrument is useful for experiments involving refractive index, apparent depth, optical alignment and small-distance measurement.
• 15. Educational Laboratory Applications
• The KCX-183 is suitable for school physics laboratories, engineering colleges, universities and scientific training institutions.
• 16. Scientific Research and Metrology
• The microscope can support appropriate precision measurement activities in research laboratories and educational metrology environments.
• 17. Practical Measurement Training
• The instrument provides a practical platform for teaching vernier scale reading, displacement measurement, optical focusing and measurement uncertainty.

Physics Laboratory Experiments

The Travelling Microscope KCX-183 is designed for experiments involving optical measurement and controlled displacement.

It is suitable for educational physics laboratories requiring a travelling microscope for practical investigations.

Refractive Index Determination

The microscope can be used in suitable optical experiments to determine the refractive index of transparent materials.

By measuring real and apparent depths using an appropriate experimental setup, students can calculate refractive index values.

Apparent Depth Measurement

The KCX-183 can support experiments involving apparent depth measurement in transparent media.

Its vertical movement and vernier scale allow users to record the positions of selected optical reference points.

Small Linear Distance Measurement

The microscope can be used to measure small distances between reference marks, specimen features and suitable laboratory measurement points.

Horizontal Displacement Measurement

The instrument's horizontal travel arrangement supports measurement of displacement along a horizontal axis.

Vertical Displacement Measurement

The vertical movement system allows users to determine changes in height or optical reference position during laboratory experiments.

Optical Alignment Experiments

The microscope can be used for aligning optical reference points and examining positional differences in suitable laboratory setups.

Engineering College Laboratories

Engineering institutions can use the KCX-183 for physics practical classes, optical measurement demonstrations and basic metrology training.

University Physics Departments

University laboratories can use the instrument for experiments involving geometrical optics, displacement measurement and measurement uncertainty.

Scientific Research Laboratories

Research laboratories can use the microscope for appropriate optical measurement and alignment tasks within its specified mechanical and optical capabilities.

Metrology Education

The KCX-183 supports teaching of vernier scale reading, precision measurement, calibration principles and dimensional measurement techniques.

Laboratory Training Centers

Scientific training institutions can use the microscope to demonstrate controlled mechanical movement, optical focusing and accurate measurement procedures.

Educational Demonstrations

Teachers and laboratory instructors can use the KCX-183 to explain optical magnification, vernier measurements and the relationship between instrument movement and measured displacement.

Working Principle

The Travelling Microscope KCX-183 operates using the principles of optical magnification and precision linear displacement measurement.

The instrument combines a microscope optical system with a calibrated mechanical movement arrangement.

The microscope is first positioned so that the selected reference point can be observed clearly through the eyepiece.

The operator adjusts the optical focus until the reference point appears sharp.

The corresponding position is recorded using the precision vernier measurement scale.

The microscope is then moved along the required measurement axis until a second reference point is aligned with the observation system.

A second vernier reading is recorded.

The displacement between the two reference positions is calculated by subtracting the initial reading from the final reading.

Measured Displacement = Final Vernier Reading − Initial Vernier Reading

For example, if the first reading is 5.20 cm and the second reading is 7.35 cm:

Measured Displacement = 7.35 − 5.20 = 2.15 cm

This is an illustrative calculation; the actual precision of the result depends on the instrument's calibrated least count and measurement procedure.

Optical Magnification

The microscope includes a 2X achromatic objective and a 10X eyepiece.

Refractive Index Measurement Principle

In a suitable apparent-depth experiment, a travelling microscope can be used to determine the real and apparent depths of a transparent medium.

For near-normal observation through a plane surface, the refractive index can be approximated by:

Refractive Index = Real Depth / Apparent Depth

Accurate results depend on the experimental setup, reference measurements and measurement procedure.

Microscope Compatibility and Usage

The KCX-183 Travelling Microscope is designed for optical measurement experiments, physics laboratory demonstrations and precision displacement measurements.

It can be used in schools, colleges, universities, engineering institutions and scientific training centers.

For measurement, users should position the instrument on a stable laboratory surface and align the microscope with the required reference point.

The optical focusing system should be adjusted until the reference point appears clear.

The initial scale reading should be recorded before moving the microscope to the second measurement position.

The final reading can then be used to calculate displacement.

For experiments involving refractive index or apparent depth, the microscope should be used with the appropriate optical apparatus and measurement procedure.

Measurement results should account for the instrument's least count, calibration and experimental uncertainty.